Committee Group: Lighting Science

Statement of Purpose

This Technical Committee develops standard test and measurement procedures with a focus on the light emitting device.

Committee Scope Parameters

  • Included subject matter: The scope includes test and measurement procedures and calculation practices for illumination characteristics of light sources.
  • Excluded subject matter: This committee does not cover specific applications of testing procedures which are addressed by the other Testing Procedures subcommittees.
Documents maintained by this committee

LM-9-09 IES Approved Method for Electrical and Photometric Measurement of Fluorescent Lamps
LM-20-13 IES Approved Method for Photometry of Reflector Type Lamps
LM-40-10 Approved Method for Life Testing of Fluorescent Lamps
LM-45-15 IES Approved Method for Electrical and Photometric Measurement of General Service Incandescent Filament Lamps
LM-47-12 IES Approved Method for Life Testing of High Intensity Discharge (HID) Lamps
LM-49-12 IES Approved Method for Life Testing of Incandescent Filament Lamps
LM-51-13 IES Approved Method for the Electrical and Photometric Measurement of High Intensity Discharge Lamps
LM-54-12 IES Guide to Lamp Seasoning
LM-58-13 IES Approved Method for Spectroradiometric Measurement Methods for Light Sources
LM-65-14 IES Approved Method for Life Testing of Single-Based Fluorescent Lamps
LM-66-14 IES Approved Method for Electrical and Photometric Measurements of Single-Based Fluorescent Lamps
LM-73-04 ANSI/IES Approved Method for Testing of Entertainment Luminaires Using Incandescent Filament Lamps or High Density Discharge Lamps
LM-78-07 IES Approved Method for Approved Method for Total Luminous Flux Measurement of Lamps Using an Integrating Sphere Photometer

Staff Liaison
  • Geomara Flores
  • Brian Liebel
  • Patricia A. McGillicuddy
Sub-Chair
  • Steven Longo, EcoLed Ventures
Vice-Chair
  • C. Cameron Miller, National Institute of Standards and Technology
Members
  • Rolf S. Bergman, Rolf Bergman Consulting
  • David J. Ellis, Intertek Testing Services
  • Andrew Jackson, Philips Lighting North America Corporation
  • Mihaly Kotrebai, GE Consumer & Industrial Lighting
  • Joseph P. Marella, Laboratory Quality Systems LLC
  • Greg McKee, Labsphere, Inc.
  • Mark B. Sapcoe, LEDVANCE LLC
  • Yuqin Zong, NIST
Advisory Members
  • Lawrence M. Ayers
  • Ellen C. Carter
  • David W. Chan, Integer Springs Sdn. Bhd.
  • Grace A. Connelly
  • Ronald O. Daubach
  • Jeff J. Demirjian
  • Mark E. Duffy, GE Consumer & Industrial Lighting
  • Phil Elizondo, Consultant
  • Steven D. Ellersick, Boeing
  • Benjamin Feagin
  • Austin A. Gelder, UL Verification Services Inc
  • Reimill Hinahon
  • Po-Chieh Hung, Konica Minolta Inc., Technology Strategy Division
  • Demetrios Karambelas
  • Tokihisa Kawabata, Konica Minolta Sensing Americas Inc
  • James E. Leland, Copia LLC
  • Robert Low
  • Derek McLaughlin, Gopher Stage Lighting
  • Don Miletich
  • Maria Nadal, NIST
  • Yoshihiro Ohno, National Institute of Standards and Technology
  • Michael Piscitelli, Sapphire Technical Solutions, LLC
  • Sagar U. Rao
  • Bipin Rao
  • Daniel Rogers, ICF Incorporated
  • Kathryn N. Tracy
  • Vivian Wu
  • Richard Young
  • Gary Yu, Interek Testing Services Hong Kong Limited.