Committee Group: Lighting Science

Statement of Purpose

This Technical Committee develops standard test and measurement procedures with a focus on solid state lighting.

Committee Scope Parameters

  • Included subject matter: The scope includes test and measurement procedures and calculation practices for illumination characteristics of solid state lighting.
  • Excluded subject matter: This committee does not cover specific applications of testing procedures which are addressed by the other Testing Procedures subcommittees.
Documents maintained by this committee

LM-79-08 IES Approved Method for the Electrical and Photometric Measurements of Solid-State Lighting Products
LM-80-15 ANSI/IES Approved Method: Measuring Luminous Flux and Color Maintenance of LED Packages, Arrays and Modules
LM-82-12 IES Approved Method for Characterization of LED Light Engines and LED Lamps for Electrical and Photometric Properties as a Function of Temperature
LM-84-14 IES Approved Method for Measuring Luminous Flux and Color Maintenance of LED Lamps, Light Engines, and Luminaires
LM-85-14 IES Approved Method for the Electrical and Photometric Measurements of High Power LEDs
LM-86-15 IES Approved Method: Measuring Luminous Flux and Color Maintenance of Remote Phosphor Components
TM-21-11 Projecting Long Term Lumen Maintenance of LED Light Sources + Addendum B
TM-26-15 Methods for Projecting Catastrophic Failure Rate of LED Packages
TM-28-14 Projecting Long-Term Luminous Flux Maintenance of LED Lamps and Luminaires

Sub-Chair
  • Eric Bretschneider, EB Designs & Technology
Staff Liaison
  • Geomara Flores
  • Brian Liebel
  • Patricia A. McGillicuddy
Vice-Chair
  • C. Cameron Miller, National Institute of Standards and Technology
Array
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Members
  • Robert C. Berger, Independent Testing Laboratories
  • Rolf S. Bergman, Rolf Bergman Consulting
  • Phil Elizondo, Consultant
  • David J. Ellis, Intertek Testing Services
  • KC Fletcher, CSA Group / Orb Optronix
  • Michael L. Grather, LightLab International
  • Yoelit H. Hiebert, Leidos Inc
  • James Hospodarsky, Acuity Brands, Inc.
  • Jeff N. Hulett, Vektrex
  • Andrew Jackson, Philips Lighting North America Corporation
  • David R. Jenkins, Synopsys, Inc. Optical Solutions Group
  • Jianzhong Jiao, Consultant
  • Mihaly Kotrebai, Current Powered by GE
  • Becky Kuebler, Cree Inc.
  • Rand W. Lee
  • Steven Longo, EcoLed Ventures
  • Joseph P. Marella, Laboratory Quality Systems LLC
  • Greg McKee, Labsphere, Inc.
  • Emil Radkov
  • Eric E. Richman, Pacific Northwest National Laboratory
  • Mark B. Sapcoe, LEDVANCE LLC
  • Gary A. Steinberg, GE Consumer & Industrial Lighting
  • Ralph C. Tuttle, Cree Inc.
  • John X. Zhang, CandelaLED Lighting LLC
  • Yuqin Zong, NIST
Advisory Members
  • Carl K. Andersen, Federal Highway Administration
  • Barry D. Besmanoff
  • Carl A. Bloomfield, Intertek Testing Services
  • Kevin C. Broughton
  • David W. Chan, Integer Springs Sdn. Bhd.
  • Jeonghyeon Choi, LG Innotek Co Ltd
  • Pei-Ting Chou, Aurotek Corporation
  • Ashfaqul Chowdhury
  • James W. Creveling, Toyoda Gosei
  • Ronald O. Daubach
  • Lynn Davis, RTI International
  • Mark E. Duffy, Current, powered by GE
  • David P. Eckel
  • Steven D. Ellersick, Boeing
  • Aaron A. Feldman, Acuity Brands, Inc.
  • Greg Flies
  • James M. Gaines, Philips Lighting North America Corporation
  • Calvin Galberth, Cree Inc.
  • Yongfeng Guan
  • Roy Harvey, OSRAM Opto-Semiconductors, Inc.
  • Timothy Henning
  • John M. Hickman, Ledra Brands, Inc. (Bruck - Alphabet - Molto Luce)
  • Reimill Hinahon
  • Mark W. Hodapp
  • Bin Hou
  • Po-Chieh Hung, Konica Minolta Inc., Technology Strategy Division
  • Asiri Jayawardena
  • SK (Sangkyoo) Jeon, Korea Institute of Lighting Technology
  • BIYONG JEONG
  • Gareth John, The Lighting Industry Association
  • Jim Kahn
  • Demetrios Karambelas
  • Tokihisa Kawabata, Konica Minolta Sensing Americas Inc
  • Evelyn B. Sahaja, LC
  • Sunghee Lee
  • Jaekwang Lee, Samsung Electronics Co,.Ltd.
  • Michael Lehman
  • James E. Leland, Copia LLC
  • Kurt M. Liepmann, OSRAM Opto-Semiconductors, Inc.
  • Jeff Lockner, Underwriters Laboratoreis Inc.
  • Min-Hao M. Lu, Acuity Brands, Inc.
  • Ruiqing Ma
  • Joe R. Marsh
  • Mark T. McClear
  • Derek McLaughlin, Gopher Stage Lighting
  • Jonathan Melman
  • Don Miletich
  • Saori Mitsuhashi, Nichia America Corporation
  • Maria Nadal, NIST
  • Dante P. Nava
  • David R. Neal
  • Brandon R. Neale
  • Andy Nishida, CECOL Inc.
  • Michael S. O'Boyle, Philips Lighting North America Corporation
  • Dan J. O'Hare
  • Yoshihiro Ohno, National Institute of Standards and Technology
  • Marcel J. Pabst
  • Doosung Park, Samsung Electronics Co,.Ltd.
  • Michael Piscitelli, Sapphire Technical Solutions, LLC
  • Michael E. Poplawski, Pacific Northwest National Laboratory
  • Bruno Primerano, OLEDWorks
  • Miko Przybyla, GL Optic
  • Mark Raffetto
  • Bipin Rao
  • Daniel Rogers, ICF
  • Michael P. Royer, PNNL
  • David Ryan
  • Heidi Steward
  • Jacki S. Swiernik, Intertek Testing Services
  • Ruth Taylor
  • Kathryn N. Tracy
  • Tatsukiyo Uchida, Panasonic Corporation
  • Yang Wang
  • Yaqi Wang
  • Daniel A. Weiss, Acuity Brands, Inc.
  • Brienne E. Willcock, Illuminart
  • Vivian Wu
  • Wensheng Xu
  • Shigeharu Yamauchi, Nichia America Corporation
  • Jeremy W. Yon, GE Consumer & Industrial Lighting
  • William Young
  • Richard Young
  • Gary Yu, Interek Testing Services Hong Kong Limited.