Committee Group: Lighting Science

Statement of Purpose

This Technical Committee reviews and approves draft standards prepared by the TPC sub-committees.

Committee Scope Parameters

  • Included subject matter: This Technical Committee review and approve standard test and measurement procedures and calculation practices for illumination characteristics of indoor luminaires, outdoor luminaires, LEDs, and other light sources.
  • Excluded subject matter: This committee does not cover specific applications of lighting test procedures.
Documents maintained by this committee

Indoor Luminaire Subcommittee
LM-15 IES Guide for Reporting General Lighting Equipment Engineering Data for Indoor Luminaires
LM-41 Approved Method for Photometric Testing Of Indoor Fluorescent Luminaires
LM-46 IES Approved Method for Photometric Testing of Indoor Luminaires Using High Intensity Discharge or Incandescent Filament Lamps
LM-62 IES Guide for Laboratory or Field Thermal Measurements of Fluorescent Lamps and Ballasts in Luminaires

Outdoor Luminaire Subcommittee
LM-28-12 Approved Method: IES Guide for the Selection, Care, and Use of Electrical Instruments in the Photometric Laboratory
LM-50-13 IES Approved Method for Photometric Measurement of Roadway and Street Lighting Installations
LM-52-03 IES Guide for Photometric Measurements of Roadway Sign Installations
LM-61-06 IES Approved Guide for Identifying Operating Factors Influencing Measured vs. Predicted Performance for Installed Outdoor High Intensity Discharge (HID) Luminaires
LM-71-14 IES Approved Guide: Photometric Measurement of Tunnel Lighting Installations
LM-75-01 Goniophotometer Types and Photometric Coordinates

Light Sources Subcommittee
LM-9-09 IES Approved Method for Electrical and Photometric Measurement of Fluorescent Lamps
LM-20-13 IES Approved Method for Photometry of Reflector Type Lamps
LM-40-10 Approved Method for Life Testing of Fluorescent Lamps
LM-45-15 IES Approved Method for Electrical and Photometric Measurement of General Service Incandescent Filament Lamps
LM-47-12 IES Approved Method for Life Testing of High Intensity Discharge (HID) Lamps
LM-51-13 IES Approved Method for the Electrical and Photometric Measurement of High Intensity Discharge Lamps
LM-54-12 IES Guide to Lamp Seasoning
LM-58-13 IES Approved Method for Spectroradiometric Measurement Methods for Light Sources
LM-65-14 IES Approved Method for Life Testing of Single-Based Fluorescent Lamps
LM-66-14 IES Approved Method for Electrical and Photometric Measurements of Single-Based Fluorescent Lamps
LM-73-04 ANSI/IES Approved Method for Testing of Entertainment Luminaires Using Incandescent Filament Lamps or High Density Discharge Lamps
LM-78-07 IES Approved Method for Approved Method for Total Luminous Flux Measurement of Lamps Using an Integrating Sphere Photometer

Solid State Lighting Subcommittee
LM-79-08 IES Approved Method for the Electrical and Photometric Measurements of Solid-State Lighting Products
LM-80-15 ANSI/IES Approved Method: Measuring Luminous Flux and Color Maintenance of LED Packages, Arrays and Modules
LM-82-12 IES Approved Method for Characterization of LED Light Engines and LED Lamps for Electrical and Photometric Properties as a Function of Temperature
LM-84-14 IES Approved Method for Measuring Luminous Flux and Color Maintenance of LED Lamps, Light Engines, and Luminaires
LM-85-14 IES Approved Method for the Electrical and Photometric Measurements of High Power LEDs
LM-86-15 IES Approved Method: Measuring Luminous Flux and Color Maintenance of Remote Phosphor Components
TM-21-11 Projecting Long Term Lumen Maintenance of LED Light Sources + Addendum B
TM-26-15 Methods for Projecting Catastrophic Failure Rate of LED Packages
TM-28-14 Projecting Long-Term Luminous Flux Maintenance of LED Lamps and Luminaires

Chair
  • Becky Kuebler, Cree Inc.
Staff Liaison
  • Alex Baker
  • Geomara Flores
  • Dawn De Grazio
  • Brian Liebel
  • Patricia A. McGillicuddy
Treasurer
  • Jianzhong Jiao, Consultant
Co-Chair
  • C. Cameron Miller, National Institute of Standards and Technology
Secretary
  • David N. Randolph, Cree Inc.
Array
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Members
  • Carl K. Andersen, Federal Highway Administration
  • Robert C. Berger, Independent Testing Laboratories
  • Rolf S. Bergman, Rolf Bergman Consulting
  • Eric Bretschneider, EB Designs & Technology
  • Phil Elizondo, Consultant
  • David J. Ellis, Intertek Testing Services
  • Michael L. Grather, LightLab International
  • Yoelit H. Hiebert, Leidos Inc
  • James Hospodarsky, Acuity Brands, Inc.
  • Jeff N. Hulett, Vektrex
  • Po-Chieh Hung, Konica Minolta Inc., Technology Strategy Division
  • Andrew Jackson, Philips Lighting North America Corporation
  • Mihaly Kotrebai, Current Powered by GE
  • Steven Longo, EcoLed Ventures
  • Joseph P. Marella, Laboratory Quality Systems LLC
  • Philip McCarthy, Hubbell Lighting, Inc.
  • Greg McKee, Labsphere, Inc.
  • Emil Radkov
  • Mark B. Sapcoe, LEDVANCE LLC
Advisory Members
  • Lawrence M. Ayers, N/A
  • Jess Baker, Schuler & Shook Inc.
  • Randall P. Bergin
  • Carl A. Bloomfield, Intertek Testing Services
  • Kevin C. Broughton
  • Ellen C. Carter
  • David W. Chan, Integer Springs Sdn. Bhd.
  • Pei-Ting Chou, Aurotek Corporation
  • James W. Creveling, Toyoda Gosei
  • Meghna Damle, Acuity Brands, Inc.
  • Ronald O. Daubach
  • Lynn Davis, RTI International
  • Jeff J. Demirjian
  • Mathieu Desjardins, Standard Products Inc.
  • Mark E. Duffy, Current, powered by GE
  • Victor Eberhard, Sternberg Lighting
  • KC Fletcher, CSA Group / Orb Optronix
  • Jim Frazer, Gridaptive Technologies
  • Jeremy Fye, Lutron Electronics Co, Inc.
  • Yongfeng Guan
  • Richard V. Heinisch
  • Kyle J. Hemmi, CLEAResult
  • Robert E. Higley, New Energy
  • Shuming Hua, National Lighting Test Centre China
  • David R. Jenkins, Synopsys, Inc. Optical Solutions Group
  • Gareth John, The Lighting Industry Association
  • Demetrios Karambelas
  • Hamid Kashaninejad, Leotek Electronics USA, LLC
  • Ryan Kelley, LTI Optics, LLC
  • John Lawton, VELUX, America, Inc.
  • Lorence E. Leetzow, MAGNARAY International
  • James E. Leland, Copia LLC
  • Kelly C. Lerbs, Building Acoustics & Lighting Laboratories Inc.
  • Richard Li
  • Monica Liang
  • Kurt M. Liepmann, OSRAM Opto-Semiconductors, Inc.
  • Jeff Lockner, Underwriters Laboratoreis Inc.
  • Robert Low
  • Min-Hao M. Lu, Acuity Brands, Inc.
  • Joe R. Marsh
  • Derek McLaughlin, Gopher Stage Lighting
  • Al Mendoza
  • Don Miletich
  • Michael M. Minarczyk
  • Maria Nadal, NIST
  • Dante P. Nava
  • Dan J. O'Hare
  • Yoshihiro Ohno, National Institute of Standards and Technology
  • Erik Page
  • Jiangen Pan, Everfine Photo-E-Info Co., Ltd.
  • Doosung Park, Samsung Electronics Co,.Ltd.
  • Nermin Peimanovic
  • Eric S. Perkins, Acuity Brands, Inc.
  • Michael Piscitelli, Sapphire Technical Solutions, LLC
  • Gerard M. Plank
  • Charles ("Richie") W. Richards
  • Daniel Rogers, ICF
  • Michael P. Royer, PNNL
  • Tobias Schneider, Instrument Systems GmbH
  • Anthony W. Serres, Signify
  • Gary A. Steinberg, GE Consumer & Industrial Lighting
  • Wayne w. Sun
  • Lane Swainston, Swainston Consulting Group
  • Jacki S. Swiernik, Intertek Testing Services
  • Ruth Taylor
  • Kathryn N. Tracy
  • Ralph C. Tuttle, Cree Inc.
  • Jonathan C. Vollers, Cree Inc.
  • Ken Wagner
  • James E. Walker, UL Verification Services Inc
  • Yang Wang
  • Daniel A. Weiss, Acuity Brands, Inc.
  • Joseph A. Welch
  • Kurt S. Wilcox
  • Vivian Wu
  • Jeremy W. Yon, GE Consumer & Industrial Lighting
  • Richard Young
  • John X. Zhang, CandelaLED Lighting LLC
  • Yuqin Zong, NIST
Honorary Members
  • Robert E. Horan, Retired
  • Donald E. Husby
  • Robert C. Speck